Si lattice parameter measurement by centimeter X-ray interferometry

Measurement of x-ray pulse widths by intensity interferometry.

The pulse width of hard undulator radiation (32 ps width, energy 14 keV) was determined by intensity interferometry. The method, in combination with various x-ray monochromators, enables measurements to be taken over a wide range of time frames, from ns to fs. The applicable target includes measurements of ultrafast x-ray pulse widths from fourth generation synchrotron light sources.

X-ray Interferometry

For the astronomer, x-ray interferometry is the theory and practice of building dilute aperture telescopes for studying celestial x-ray sources. The short wavelengths and high surface brightness of x-ray sources will make the eventual scientific payoff very high, with direct imaging of the event horizons of black holes as the centerpiece. In this article we review the history of x-ray interfero...

EVALUATION OFDISLOCATION STRUCTURE AND CRYSTALLITE SIZE IN WORN AL-SI ALLOY BY X-RAY DIFFRACTION

Abstract: powerful method for the characterization of microstructures of crystalline materials in terms of crystallite size anddislocation structures. In this paper the effect of the sliding on the microstructure of A356 in the as-cast and heattreated conditions are studied, The X-ray phase analysis shows that with increasing applied load, the dislocationdensity is increased, whereas the crysta...

X-ray Interferometry – Ultimate Imaging

Effect of isotopic composition on the lattice parameter of germanium measured by x-ray backscattering